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Tuesday, May 19, 2020 | History

2 edition of Functional fault equivalence and automated diagnositc test generation using conventional ATPG. found in the catalog.

Functional fault equivalence and automated diagnositc test generation using conventional ATPG.

Robert Ching Wei Chang

Functional fault equivalence and automated diagnositc test generation using conventional ATPG.

by Robert Ching Wei Chang

  • 219 Want to read
  • 15 Currently reading

Published in 2005 .
Written in English


Edition Notes

Statementby Robert Ching Wai Chang.
The Physical Object
Paginationvi, 44 leaves.
Number of Pages44
ID Numbers
Open LibraryOL20421837M

Title: Microsoft PowerPoint - lecture7 Author: Mehdi Tahoori Created Date: 6/24/ PM. Cell-aware fault models directly address layout-based intra-cell defects. They are created by performing analog simulations on the transistor-level netlist of a library cell and then by library view synthesis. The cell-aware fault models may be used to generate cell-aware test patterns, which usually have higher defect coverage than those generated by conventional ATPG techniques.

  Featuring a model-based approach to fault detection and diagnosis in engineering systems, this book contains up-to-date, practical information on preventing product deterioration, performance degradation and major machinery damage.;College or university bookstores may order five or more copies at a special student price. Online Fault Diagnosis Test - Practice Test Download Fault Diagnosis Test - Practice Test. As modern equipment of all types becomes more dependent on electronic control systems (and arguably more complex) the ability to approach problems logically in order to find the cause of the fault is increasingly important.

Extensive research in the field of fault detection and diag- nosis has produced useful tools and techniques that have been applied to continuously operating building HVAC systems. A few researchers have applied some of these to commissioning of new buildings. This paper reports on a project that adapted or developed models of air-handling unit components and controls and combined them into .   Course: VLSI Design, Verification and Test Instructor: Dr. Santosh Biswas Department of Computer Science and Engineering,IIT Guwahati.


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Functional fault equivalence and automated diagnositc test generation using conventional ATPG by Robert Ching Wei Chang Download PDF EPUB FB2

Functional Fault Equivalence and Diagnostic Test Generation in Combinational Logic Circuits Using Conventional ATPG Andreas Veneris1;2 Robert Chang1 Magdy S. Abadir3 Sep Seyedi1 Abstract Fault equivalence is an essential concept in digital design with significance in fault diagnosis, diagnostic test gen-eration, testability analysis and logic synthesis.

equivalence is a relation that allows faults in a circuit to be collapsed. into disjoint sets of equivalent fault classes. Fault equivalence is es.

sential in digital VLSI because it has. Fault Equivalence and Diagnostic Test Generation Using ATPG Abstract Faultequivalence isan essential concept indigital design withsignif-icance in fault diagnosis, diagnostic test generation, testability anal-ysis and logic synthesis.

In this paper, an efficient algorithm to check whether two faults are equivalent is presented. If they are not equiv. Functional Fault Equivalence and Diagnostic Test Generation in Combinational Logic Circuits Using Conventional ATPG Article (PDF Available) in Journal of Electronic Testing 21(5) Fault equivalence is an essential concept in digital design with significance in fault diagnosis, diagnostic test generation, testability analysis and logic synthesis.

In this paper, an efficient Functional Fault Equivalence and Diagnostic Test Generation in Combinational Logic Circuits Using Conventional ATPG | SpringerLinkCited by: Veneris A, Chang R, Abadir M and Seyedi S () Functional Fault Equivalence and Diagnostic Test Generation in Combinational Logic Circuits Using Conventional ATPG, Journal of Electronic Testing: Theory and Applications,(), Online publication date: 1-Oct matic test pattern generation (ATPG) tool.

This, in turn, helps reduce the number of test-patterns, the runtime of ATPG, and the time required for design validation and fault diag-nosis. It is also important that the computation of equivalent faults is fast.

Otherwise, it may substantially increase the run-time of an ATPG. diagnostic tests using the single stuck-at fault model. Main ideas introduced there were a definition of di-agnostic coverage and algorithms for diagnostic sim-ulation and exclusive test generation. In that work emphasis was placed on using the existing tools that were originally designed for fault.

Fault Equivalence Number of fault sites in a Boolean gate circuit = #PI + #gates + # (fanout branches). Fault equivalence: Two faults f1 and f2 are equivalent if all tests that detect f1 also detect f2. If faults f1 and f2 are equivalent then the corresponding faulty functions are identical.

Fault collapsing: All. Fault Equivalence • Fault equivalence: Two faults f1 and f2 are equivalent if all tests that detect f1 also detect f2.

• If faults f1 and f2 are equivalent then the corresponding faulty functions are identical. • Fault collapsing: All single faults of a logic circuit can be divided into disjoint equivalence. Automatic Test Pattern Generation Fundamentals. Introduction to Automatic Test Pattern Generation Purpose Introduction to Automated Test Pattern Generation The Vector Generation Process Flow The Reasons for ATPG Why ATPG.

Pro and Con Perceptions of ATPG Diagnostic Fault Simulation Functional Scan-Out At-Speed Scan (AC) Test Goals AC Test Goals. Fault simulation with functional patterns is important for at-speed test applications to detect small delay faults and achieve the parts-per-million (PPM) defect level goals.

The theory and implementation of an ATPG engine have also been described in detail in the second half of this chapter. The paper presents a new method and an algorithm for structural fault collapsing to reduce the search space for test generation, to speed up fault Abadir, M.S., Seyedi, S.: Functional fault equivalence and diagnostic test generation in combinational logic circuits using conventional ATPG.

Jürimägi L., Orasson E., Raik J. () Fault. The fault simulators can be stand-alone tools or used as an integrated feature in the automatic test pattern generation (ATPG) programs.

Test generation remains to be an important research area as circuit sizes and complexities continue to increase. New and powerful algorithms are needed to cope with the increased complexity. Fault simulation is known to be a reliable means for determining the single stuck-at fault coverage provided by a set of test vectors.

The degree to which a test vector suite detects the faults is known as the fault coverage of the suite. This procedure referred as fault grading. Starting right from the basics, the authors take the reader through automatic test pattern generation, design for testability and built-in self-test of digital circuits before moving on to more advanced topics such as IDDQ testing, functional testing, delay fault testing, memory testing, and fault diagnosis.

The book includes detailed treatment. An augmented defect diagnosis procedure removes tests from consideration in order to improve the accuracy of defect diagnosis by reducing the number of candidate faults.

This work studies the role of diagnostic test generation in this context. Diagnostic test generation increases the number of tests that are used for defect diagnosis in order to increase its accuracy. Fault A equivalent to fault B if every test for A is also a test for B and vice versa.

Faults are indistinguishable. Group equivalent faults into a fault -equivalence class (FEC) Only one fault from a FEC needs to be tested.

Fault A dominates fault B if any test for B also detects A, but only some of A tests detect B. The relation of functional equivalence partitions the set of all possible faults into functional equivalence classes. For fault analysis it is sufficient to consider only one representative fault from every equivalence class.

Equivalence Fault Collapsing. With any n-input gate we can associate 2(n + 1) single stuck faults. Featuring a model-based approach to fault detection and diagnosis in engineering systems, this book contains up-to-date, practical information on preventing product deterioration, performance degradation and major machinery damage.;College or university bookstores may order five or more copies at a special student price.

Price is available upon request/5(2). ‘The book on hand is one of the few comprehensive works on the market covering the fundamentals of model-based fault diagnosis This is an impressively comprehensive and well-prepared work.

Each chapter begins with an introduction and ends with a summary, and is .In this case, output SA0 fault is dominant and can be removed from fault list. Functional collapsing. Two faults are functionally equivalent if they produce identical faulty functions or we can say, two faults are functionally equivalent if we can not distinguish them at primary outputs (PO) with any input test .fault-based testing, on the quality of the fault model.

This also implies that developing better fault models, based on hard data about real faults rather than guesses, is a good investment of effort. Mutation Analysis Mutation analysis is the most common form of software fault-based testing. A fault.